Chroma    
Call Us Toll Free: 1-800-478-2026
 
   
  Semiconductor Test Equipment  
   
 
 

IC Pick & Place Test Handlers

Automatic System Function Tester (ASFT)

SoC Test System

Visual Inspection System

 

Quick Links

Chroma Home

Contact Us

 
Model 3270 Miniature IC Handler

Model 3270 Miniature IC Handler

 

Key Features

  • Reliable high-speed pick & place handler
  • 3x3 mm miniature device handling capability
  • Air damper for contact balance
  • Auto contact force learning
  • Socket damage free
Data Sheet
 
Product Details

The Chroma 3270 is an innovative handler for high volume/multisite miniature IC testing, especially for CIS Testing (CMOS Image Sensor), at system level. It is capable of handling devices of a large variety of package types including QFP, TQFP, BGA, PGA, etc. The handler uses pick and place technology to pick up devices from JEDEC trays, move them to the test site, then move them to the appropriate bin after test.

Chroma 3270 can handle 16 devices for parallel test at ambient temperature to high temperature 50°C.

 

Turn-Key Solution for CIS Test & Inspection

 

 
                 
 
Follow Us
 
Share |
 
                 

Privacy Policy | Terms of Use

Copyright © Chroma ATE, Inc. All Rights Reserved.