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Model 3270 Miniature IC Handler

Model 3270 Miniature IC Handler


Key Features

  • Reliable high-speed pick & place handler
  • 3x3 mm miniature device handling capability
  • Air damper for contact balance
  • Auto contact force learning
  • Socket damage free
Data Sheet
  • Product Details
  • Specifications
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Product Details

The Chroma 3270 is an innovative handler for high volume/multisite miniature IC testing, especially for CIS Testing (CMOS Image Sensor), at system level. It is capable of handling devices of a large variety of package types including QFP, TQFP, BGA, PGA, etc. The handler uses pick and place technology to pick up devices from JEDEC trays, move them to the test site, then move them to the appropriate bin after test.

Chroma 3270 can handle 16 devices for parallel test at ambient temperature to high temperature 50°C.


Turn-Key Solution for CIS Test & Inspection





Dimensions and Weight

Dimensions : 2100 mm(W) x 1540 mm(D) x 1720 mm(H)
Net Weight : 1300 kg
Power Requirement Power supply : AC 220V ± 10%, 50/60 Hz 3-Phase
Maximum power consumption : 12KVA, 20A
Compressed Air : Dry air of 5.0 kg/cm² (0.49 Mpa) or higher, constant supply
Applicable Device Type : BGA series, μBGA, PGA, QFP series, CSP, WCSP, PLCC, QFN, TSOP
Outer dimensions : 3 mm x 3 mm to 14 mm x 14 mm
Lead / Ball pitch : 0.4 mm / 0.5 mm above
Multiple Test Sites 16 sites
Index Time 5 sec (Exclude power and communication time)
Cycle Time One site cycle time 6 sec (4 site simultaneously, tray pitchfixed)
Jam Rate 1/2000 pcs
Applicable Tray Standard tray size : JEDEC 135.9 mm(W) x 315 mm(L)
Tray thickness : 7.62 mm
Categories 5 Categories, 1 Auto, 4 Fixed
(accepts 128 bin signals for RS-232)
Contact Force Max. 20 kgf ( Accuracy ±1kgf )
High Temperature (Optional) Operating mode : room temperature / high temperature
Temperature setting range : Ambient to 50°C
Tester Interface Standard : RS-232

All specifications are subject to change without notice.

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