- MCU/MCU + Embedded Memory
- NAND Flash Controller
- PC I/O
- Switch ICs
- Smart Power Management Devices
- Mixed Signal, Digital and Analog ICs
- ADC/DAC/CODEC ICs
- Consumer ICs
- Engineering, Wafer Sort and Final Test
- Power ICs
- LED Driver ICs
Chroma 3650-CX brings you the low cost and high performance test solution
3650-CX adopts the all-in-one design to provide a compact size ATE with very low cost, high accuracy and high throughput for customers to save the cost and raise the profit. With the versatile test capabilities and powerful software tools, 3650-CX is designed for MCU, NAND flash controllers, the peripheral devices of PC, switch devices, LED driver ICs, power ICs and consumer SoC devices.
CRISP-the powerful system software for 3650-CX
The 3650-CX features the powerful suite of software tools using Chroma Integrated Software Platform, CRISP. Not only provides the rapid test developing functions, CRISP covers all needs for test debugging, production and data analysis. Base on the Microsoft Windows XP® operation system and C++ programming language, CRISP provides the powerful, easy-to-use, intuitive and fast-runtime GUI tools for users. The CRISP includes test plan debugger, pattern editor, waveform tool, scope tool, pin margin, Shmoo, wafer map, histogram, STDF tool, datalog ....etc.
All-in-one design and compact size to save the floor space
With the air-cooled and zero footprint tester-in-a-test-head design, 3650-CX delivers high throughput in a highly integrated package for minimum floor space. With an optional manipulator, 3650-CX can be used in both package and wafer sort test.
The 3650-CX provides multiple drivers for communications with handler and prober by GPIB and TTL interface. The supported handlers or probers include SEIKO-EPSON, SHIBASOKU, MULTITEST, ASECO, DAYMARC, TEL, TSK and OPUS II, and so forth.