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Model 58620 Laser Diode Characterization System
Chroma 58601 Optoelectonic Source Measurement System
Key Features
  • Full Turn-Key Automated Test for edge and surface emitting laser diodes
  • High precision and large capacity carrier, interchangeable with other automated equipment
  • Fully automated alignment for fiber-coupled tests
  • Automated optical inspection decreasing mechanical positioning Takt time
  • Highly accurate TEC temperature controller with stability up to ±0.01° C
  • PXI-Based SMU and power meter for fast test times
  • Full suite of software analysis tools for laser diode characterization

Data Sheet

 
  • Product Details
  • Specifications
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Product Details

58620 CHARACTERIZATION STATION OVERVIEW

The Chroma 58620 Laser Diode Characterization Station is a state-of-the-art full turnkey system specically designed for Laser Diode testing. Features range from macro inspection of the facet or aperture active area to a full suite of electro-optical parametric tests. When used in conjunction with Chroma’s high capacity carrier, multiple devices can be rapidly indexed to improve not only test times but also repeatability which produces a large impact on yield and quality control. The Chroma 58620 is equipped with an ultra stable and uniform thermal control platform to incorporate R&D-style tests in a production environment.

 

ULTRA PRECISE CARRIER DESIGN

58620 Laser diode characterization systemFrom vast experience in the Semiconductor industry, Chroma introduces a precision and high capacity carrier which may be designed to accommodate a large array of mechanical form factors such as Chip on Carrier (CoC), Chip on Submount (CoS), Transistor Outline (TO), or Laser Bars. The highly innovative bi-lateral design's symmetry allows components to be placed on both sides allocating a larger batch of components. The carrier’s multi-layer conguration allows for components to be easily inserted manually or by a robotic pick and place system. Surfaces and materials are engineered to optimize thermal contact to the device under test (DUT) allowing for ecient heat transference and a high level of temperature control. Once the carrier is inserted, the robotics take over and perform a wide-range of pre-dened automated tests on all devices (both sides) in the carrier.

 

MULTI-PURPOSE PLATFORM

The Chroma 58620 is equipped with a fully-automated alignment station to simulate or correlate to real-world Optical Sub-Assembly (OSA) testing. These parameters include, but are not limited to, power, coupling eciency and spectral performance. Equipment used can be as simple as a fiber-coupled power meter and spectrometer, or as complex as a full-featured Optical Spectrum Analyzer to measure Side-Mode Suppression Ratio and more. Other stations may incorporate an integrating sphere for raw output measurements and current sweep curves, or even capacitance metrology equipment if necessary. Since the carrier is indexed to position and bar-coded for traceability, every device is tagged with an identication code. This enables the Chroma 58620 to provide the user with traceable data to either reduce the need for down-stream testing, or accurate device-specic correlation to nal package test parameters.

 

CROSS-PLATFORM COMPATIBILITY

The carrier, designed for a particular product type used on the Chroma 58620, can also be used in other processes. This enables the user to form a streamlined, fully automated, Laser Diode verication process. These processes are, but not limited to, Chip/Wafer Qualication, Life-Test, Burn-In, Chip Characterization, and Final Production Test. The carrier is designed to be inter-operable with the Chroma 58601-family of Opto-Electronic Burn-In and Life Test systems. Devices can be left in the carrier to burn-in for hours or months, collect valuable in-situ degradation data, and then inserted into the 58620 for full-scale characterization. With access to pre-test, burn-in, and post-test parametric information, the user can generate accurate component models that are empirically based. This adds tremendous value when working to increase yield or compare to theoretical expectations.

 

FRIENDLY AND FLEXIBLE USER INTERFACE

The Chroma 58620 features a complete user-friendly Graphical User Interface (GUI) that includes recipe generation, test sequence execution, and sophisticated data management with export to standard MES or proprietary database systems. There are rapid pre-verication features to ensure correct part positioning such as initial continuity testing and DUT photographs. This allows the user to be alerted and the opportunity to adjust for maximum test time eciency and yield. Recipe generation enables the user to create complex test plans for an entire carrier or by DUT position. The display echo’s to the user the complete battery of parametric data in tabular or graphical form. All or a select number of opto-electronic parameters such as output power sweep curves or spectral proles can be displayed and manipulated. The Chroma 58620 provides the user with an accurate picture of nal test yield based no carrier or production lots. Once the tests are performed, the Data Management system can allow for local viewing or remote storage to a wide array of MES architectures or proprietary databases and le systems.

 

 

Specifications
Device Under Test
Form Factor CoC, CoS, Edge-emission laser (singlet or bar)
Channels in Carrier 80 Channels per cycle *1
Current Ranges (Chroma Model 52401)
Current Ranges (Source & Measurement) ±200nA / 2μA / 20μA / 200μA /2mA / 20mA / 200mA
Current Resolution ±1.6pA/±16pA/±160pA/±1.6nA/±16nA/±160nA/±1.6μA
Current Accuracy (Source & Measurement) I range ≥1mA : 0.1% + 0.1% FS ; I range < 1mA : 0.05%+0.2% FS
Voltage Ranges
Compliance Voltage Range ±0.5V/1V/2.5V/5V/10V/25V
Compliance Voltage Accuracy ≥1V: 0.05% + 0.01%FS ; <1V: 0.05% + 0.1%FS
Voltage Measurement ±3.8nV~± 25V
Voltage Measurement Accuracy 0.05% + 38nV @ 0.5V to 0.05% + 1.9mV @25V
Test Parameters
Electrical L-I-V Curves, Ith, Vf, Rs, Linearity (Kink)
Spectral λp, λc, λrms, λFHWM, Mode spacing, and others
Optical Spectrum Analyzer*(Optional)
Wavelength Range 700 nm to 1700 nm
Resolution bandwidth < 0.1 nm
SMSR Measurement < 1 dbm
Wavelength Accuracy ±0.03 nm
Integrating Sphere
Integrating Sphere Diameter 2 inch
Detector Port area 3mm
Wavelength Range 400~2000nm
CCD Camera
Working Distance 6.5 mm
Resolution 6.7 um
Magni cation 8x~16x
Optical Power Meter (Chroma Model 52962)
Channel Dual channels
Wavelength Range (InGaAs Based) 900 to 1700nm
Minimum Power / Current -70 dBm
Maximum Power / Current +10 dBm
Resolution 0.01dB
Dynamic Range 80dB
Accuracy ±5%
Linearity 0.1dB
Measurements per Second >5000
Fibre Types Supported 50/125um 62.6/125um multimode and single
Connector Interface FC
Form Factor 3U PXI
Thermal-Electrical Controller (Chroma Model 54130)
Output Power 300W
Temperature Range 0°C ~ 80°C
Temperature Accuracy 0.3°C
Temperature Uniformity* ±0.5°C
Cooling System External chiller
Mechanical Specifications
Motion Stage Travel Distance 400 mm
Minima Fine Stage Resolution 20 nm
System Size 1000mm(W) x1200mm(D) x 1350mm(H)
System Weight 400 ± 20 Kg
Power Input 220V single phase 50/60 Hz
Water ow Rate <3~5 lpm
Operating Environment Temperature : 20°C ~25°C ; Humidity : <70%
Software
Operating System Supported Microsoft Windows® 2000 XP or 7

All specifications are subject to change without notice.

Note *1: Capacity of carrier depends on the DUT size and form factor.
Note *2: Chroma 58620 is compatible with multiple Optical Spectrum Analyzers. Please inquire for further details.
Note *3: Temperature uniformity is dependent on operating temperature ±(1°C + 1%ΔT).

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