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Optoelectronic Source Measurement System

Burn-in, Reliability & Life Test System

LED Total Power Test System

Configurative System

Wafer Inspection System

LED Test System

Benchtop Test Systems

LED Light Bar Test System

LED Test Modules

Thermal Multi-Function Data Logger

Laser Diode Characterization System

Burn-In, Reliability and Life Test Systems

VCSEL Laser Diode Wafer / Chip
Test Prober

Wafer Inspection System

Benchtop Test Systems

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LED Test & Automation Instruments and Systems
58601
Model 58601
Optoelectronic Source Measurement System
  • For Burn-In, Reliability & Life Testing
  • Up to 800 channels
  • Up to 40A per device
  • Up to 150° C
58182
Model 58221
LED Electrical Test Module

  • Focused on High voltage (HV) and High Power (HP) LED application design
  • Hardware sequencer/ program memory / data memory built inside
58150
Model 58150
Configurative LED System

  • Easy to use software interface
  • 30 degree ø rotation range
  • Auto chip horizontal adjustment
7935
Model 7935
Wafer Inspection System
  • Maximum 8 inch wafer handling capability
  • Edge finding to test various wafer shapes
  • Chip Optical Character Recognition > 98%
58182
Series 51101 / 51101C
Thermal/Multi-Function Data Logger

  • Models with 1, 8, and 64 channels on-line data recording.
  • Support B, E, J, K, N, R, S, and T type thermal couples
58154
Model 58154
ESD Test System
  • Two Model ESD Pulse Generation : Human body model and Machine model
  • Programmable Auto Test : Pulse delay, cycle and polarity are programmable
58185
Model 58185
Side-view LED Light Bar Test System
  • Measure the side-view light bar uniformity composed of white light or RGB LED
  • Excellent optical performance
  • ESD damaged sorting function
Customized Luminaire In-Line Test System
Model 58158-SC
Luminaire In-Line Test System
  • Mass production application: LED lamp, LED bulb, LED bar, LED streetlight, and other luminaires
  • Less error compared to integrating sphere measurement
58182
Model 58182
Top-view LED Light Bar Test System
  • Measure the top-view light bar uniformity composed of white light or RGB LED
  • Equipped with image recognition function to capture the LED location accurately
 
Laser Diode Test & Automation Solutions
58601
Model 58620
Laser Diode Characterization System
  • Full Turn-Key Automated Test for edge and surface emitting laser diodes
  • High precision and large capacity carrier, interchangeable with other automated equipment
58601
Model 58601
Optoelectronic Source Measurement System
  • For Burn-In, Reliability and Life Testing
  • Up to 800 channels
  • Up to 40A per device
  • Up to 150° C
58173-V Laser Diode VCSEL Test System
Model 58173-V
VCSEL Laser Diode Wafer / Chip
Test Prober

  • Fine resolution CCD scanner with precision wafer mapping
  • High-speed automated prober
  • Wide spectral range for both power and wavelength measurement
7935
Model 7935
Wafer Inspection System
  • Maximum 8 inch wafer handling capability
  • Edge finding to test various wafer shapes
  • Chip Optical Character Recognition > 98%
52411
Model 52400 Series
Four Quadrant Source
  • High & programmable voltage / current slew rate 
  • Low output noise 
  • High programming / measurement speed
 
 
                 
 
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