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Automatic System Function Tester (ASFT)
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Model 3260 Automatic System Function Tester
6 Sites
Product Details
Chroma 3260 is an innovative handler for high volume/multisite IC testing at system level. It is capable of handling packages of various types including QFP, TQFP, BGA, PGA, etc. The handler uses pick and place technology to pick up devices from JEDEC trays, move them to the test site, then move them to the appropriate bin after test. It features a 90-degree device rotation which is required for various pin one orientations. Chroma 3260 can test up to 6 devices in parallel at high temperature with ATC (Auto Temperature Cooling) ranging from 50 ˚C to 125˚C. Benefits
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