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Model 3650-CX SoC Test System
Versatile Compact Size IC Tester for Digital, Mixed Signal and Analog ICs

Model 3650-CX SoC Test System

Key Features

  • 50 /100 MHz Test Rate
  • Up to 256 digital I/O pins
  • 16/32 MW vector memory
  • 16/32 MW pattern instruction memory
  • Multi-site testing up to 32 sites
  • 16 DPS Channels
  • 8 PMU Channels
  • Per-Pin timing/frequency measurement resource
  • Up to 1024M bit x 4 CH scan depth option
  • ALPG option for memory test
  • Up to 16 high-voltage pins
  • 16 high-performance DPS channels
  • Microsoft Windows® XP OS
  • C++ and GUI programming interface
  • CRISP, full suite of intuitive software tools
  • Easy integration with 3rd party instruments
  • Air-cooled, All-in-one design and space-saving footprint
  • Cable Mount/Direct Mount


Product Details


  • MCU/MCU + Embedded Memory
  • NAND Flash Controller
  • PC I/O
  • Switch ICs
  • Smart Power Management Devices
  • Mixed Signal, Digital and Analog ICs
  • Consumer ICs
  • Engineering, Wafer Sort and Final Test
  • Power ICs
  • LED Driver ICs

Chroma 3650-CX brings you the low cost and high performance test solution 
3650-CX adopts the all-in-one design to provide a compact size ATE with very low cost, high accuracy and high throughput for customers to save the cost and raise the profit. With the versatile test capabilities and powerful software tools, 3650-CX is designed for MCU, NAND flash controllers, the peripheral devices of PC, switch devices, LED driver ICs, power ICs and consumer SoC devices.

CRISP-the powerful system software for 3650-CX 
The 3650-CX features the powerful suite of software tools using Chroma Integrated Software Platform, CRISP. Not only provides the rapid test developing functions, CRISP covers all needs for test debugging, production and data analysis. Base on the Microsoft Windows XP® operation system and C++ programming language, CRISP provides the powerful, easy-to-use, intuitive and fast-runtime GUI tools for users. The CRISP includes test plan debugger, pattern editor, waveform tool, scope tool, pin margin, Shmoo, wafer map, histogram, STDF tool, datalog ....etc.

All-in-one design and compact size to save the floor space 
With the air-cooled and zero footprint tester-in-a-test-head design, 3650-CX delivers high throughput in a highly integrated package for minimum floor space. With an optional manipulator, 3650-CX can be used in both package and wafer sort test.

The 3650-CX provides multiple drivers for communications with handler and prober by GPIB and TTL interface. The supported handlers or probers include SEIKO-EPSON, SHIBASOKU, MULTITEST, ASECO, DAYMARC, TEL, TSK and OPUS II, and so forth.

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