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Model 58604 Laser Diode Burn-in and Reliability Test System
Key Features
  • Applicable for burn-in, reliability and life testing
  • ACC and APC burn-in modes
  • Individual channel driving and measurement
  • Up to 500mA driving per channel
  • Precise temperature control up to 125°C
  • Individual module operation





Data Sheet

Product Details

Burn-In, Reliability & Test

The Chroma 58604 is a high density, multifunction, and temperature controlled module for laser diode burn-in and lifetime tests. Each module has up to 256 SMU channels which can source current and measure voltage in various control modes as described below.

Auto Current Control Mode

In auto current control (ACC) mode, the control circuit will provide the present current to each laser diode with high stability. No matter how the device resistance and temperature change, the current will be kept constant over the test period. The device voltage will be recorded as a quality reference parameter.

Auto Power Control Mode (APC)

With feedback signal from the optional external Photo Diode PCB, the control circuit can adjust the laser diode current automatically to keep constant feedback signal strength, which means the optical output of the laser diode is maintained constant over the test period. The device voltage and current are recorded as quality parameters for reference.

Temperature Control

A proprietary designed heat plat will control the laser diode case temperature with high accuracy, excellent stability, and good uniformity. Compared with oven or chamber types of laser diode burn-in systems, our solution is much more compact, easier to operate, better performance, and energy saving. Customers gain benefit for small footprint, versatile usage, and easy maintenance.

Individual Module Operation

Customers can set different modules in different temperatures, operated in different control modes, and with different start and stop times. This provides great flexibility in operation.

Protection and Individual Channel Shotdown

The control circuit is specially designed for protecting laser diodes. No rush current or voltage will occur to hurt the devices. High/Low limits of current and voltage can be set to perform shutdown protection. When abnormality happens, only the particular channel will be shutdown while others are running normally. Besides the protection functions implemented in the control circuit, isolation and ESD protection are also taken care in system design.

Auto Data Recovery after Communication Interruption

The burn-in data are stored in system PC and optional remote servers. If the communication between the module and PC is broken temporarily, the data will be dumped to the PC/server without loss.


▲ Flexible to choose condition

▲ Comprehensive test data

▲ GUI calibration interface


▲ TO-CAN carrier

▲ CoC carrier

▲ Test Fixture

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