Chroma    
Call Us Toll Free: 1-800-478-2026
 
 
 
  Semiconductor Test Equipment  
   
 
 

IC Pick & Place Test Handlers

Automatic System Function Tester (ASFT)

SoC Test System

Visual Inspection System

Metrology System

 

Quick Links

Chroma Home

Contact Us

 
Semiconductor / IC Test Equipment

 

Today’s logic IC has to integrate multiple functions. The complex System-on-Chip (SoC) is not only equipped with the features of digits, simulation, power and built-in storage, but is also a challenge for test devices.

The VLSI test system can precisely simulate the logic IC's electric signals and rapidly interpret the test results. The expansion of Test Head is capable of executing multiple test programs for massive multi-sites to improve the throughput. In addition, the customized test device can replace the general purpose tester to fit in the specified requirements that can actually meet the goal of reducing test cost.

In the back end of IC process, handlers are used to sort the products with different types of package. After package testing, the Automatic System Function Tester, which tests IC in a real environment instead of simulation by IC testers, are used for tests of complicated IC with high fault coverage and low cost and highly improves test quality.

IC Pick & Place Test Handlers
3110
Model 3111
Mini Tabletop Single Site
Test Handler
  • 600 mm x 565 mm x 800 mm
  • JEDEC trays (2)
  • IC packages: 5x5mm~45x45mm
  • Alerts to mobile device
  • Continuous automated re-test
3110
Model 3110
Hybrid Single Site Test Handler
  • FT + SLT handler – two in one
  • Perfect for device engineering characterization gathering and analysis
  • Auto tray load/unload & device sorting capability
3160
Model 3160
Final Test Handler
  • Flexible DUT Configuration
  • Adjustable P&P Interval
  • Air damper buffer to reduce contact force impact
  • Intelligent socket IC leftover check
3813
Model 3813
Touch Panel Multi-Sites IC Test Handler
  • Reliable Touch Panel Test Handler
  • For both digital and analog touch panel test
  • Touch panel size: 6 inch x 3 sites or 12.1 inch x 1 site
3270
Model 3270
Miniature IC Handler
  • Reliable high-speed pick & place handler
  • 3x3 mm miniature device handling capability
  • Air damper for contact balance
  • Auto contact force learning
3280
Model 3280
xSD Card Tester and Handler
  • Tester & Handler Integration
  • Test 120pcs micro SD in parallel
  • Test-in-Tray, no pick & place arm before sorting
  • UPH = 5400 with 70 sec test time
3810
Model 3810
Touch Panel Semi-auto Handler
  • Reliable Panel Handler
  • Panel Size: 3" to 6.5"
  • Up to 6 sites for test at the same time
  • USB interface
  • No test panel contact force damage problem
   
 
Automatic System Function Tester (ASFT)
3260
Model 3260
Automatic System Function Tester
6-sites
  • Reliable high-speed pick & place handler
  • Tester zero waiting time
  • Gull wing package capability
  • No socket damage
   
 
SoC Test System
Model 3680 Advanced SoC/Analog Test System
Model 3680
Advanced SoC/Analog Test System
  • 24 interchangeable slots for digital, analog and mixed-signal applications
  • 150 Mbps up to 1 Gbps data rate (muxed)
  • Up to 512 sites parallel test
  • Up to 2048 digital 1/0 pins
3650
Model 3650
SoC Test System
  • 50 /100 MHz
  • 512 digital I/O pins
  • 16/32 MW vector memory
  • 16/32 MW pattern instruction memory
  • Multi-site testing up to 32 sites
3650
Model 3650-EX
SoC/Analog Test System
  • 10 interchangeable slots for digital, analog and mixed-signal applications
  • 50/100 MHz clock rate, 100/200 Mbps data rate
  • Up to 512 sites parallel test
  • Up to 1024 digital I/O pins
36010
Model 36010
Programmable Pin Electronics Module
  • Standard PXI 3U form factor
  • 100MHz maximum date rate
  • 8 channels with per-pin, per-cycle bidirectional control
  • 32M sequence command memory
36020
Model 36020
Four-quadrant DUT Power Supply
  • 4 channels in a PXI Standard 3U form factor
  • +5V/-2V and +10V/-2V force ranges
  • 16-bit voltage force resolution
  • 18-bit current measurement resolution
52411
Model 52400 Series
Four Quadrant Source
  • High & programmable voltage / current slew rate 
  • Low output noise 
  • High programming / measurement speed
Model 3650-CX SoC Test System
Model HDAVO
High Density Audio Video Option
  • 8 channels of arbitrary waveform generator (AWG) and 8 channels of digitizer (DGT) per board
  • Provide high frequency mode and high resolution mode for both AWG and DGT
Model 3650-CX SoC Test System
Model 33010
High Speed PXIe Digital IO Card
  • Standard PXIe bus connector
  • 100MHz maximum clock rate
  • 32 channels per board
  • Extendable up to 256 channels in one chassis
  • Any pin to any site
Model 3650-CX SoC Test System
Model 33011
Universal Relay Driver Control
  • PXI-e based universal relay control for semiconductor load boards
  • 32CH direct relay drivers
  • 2 lanes of SPI relay control interface
Model 3650-CX SoC Test System
Model 3650-CX
SoC Test System

Versatile Compact Size IC Tester for Digital, Mixed Signal and Analog ICs
  • 50 /100 MHz Test Rate
  • Up to 256 digital I/O pins
  • 16/32 MW vector memory
  • 16/32 MW pattern instruction memory
Model 3650-CX SoC Test System
Model 33020
PXIe Programmable Device Power Supply
  • High channel density with 8 channels per card
  • -6V~12V independently programmable voltage level
  • Max. 250mA (500mA at 6V) current per channel
Model 33021
High Voltage Device Power Supply
  • Max. 48V DC output with 2 channels per card
  • -12V ~ 48V independently programmable voltage level
  • Max. 250mA current per channel
 
Visual Inspection Test System
7970
Model 7970
CMOS Image Sensor
Inspection System
  • Complete chip appearance inspection including glass and ball side of the chip
  • On-fly acquisition can get clear images and reduce processing time.
 
 
Metrology System
Model 7505
Semiconductor Optical Metrology System
  • Uses White Light Interference Measurement Technique to conduct nondestructive and rapid surface profile measurement and analysis.
   
 
                 
 
Follow Us
 
Share |
 
                 

Privacy Policy | Terms of Use

Copyright © Chroma ATE, Inc. All Rights Reserved.