Key Features Combination Final Test & System Level Test Handler (2-in-1 System) Perfect for device engineering characterization gathering and analysis Supports Remote Control Function Auto tray load / unload & device sorting capability Tester zero waiting time Maximize Test Socket lifetime Air damper for excellent contact balance Anti-double stack feature Camera for real time system monitoring Tri-temp IC test function (optional) High power cooling function (optional) Diskless download function (optional)

The Chroma 3110-FT is an innovative pick & place system ideal for characteristics evaluation, development, and IC final test.

The system is capable of handling a vast variety of device types and sizes ranging from 3x3 mm to 45x45 mm. To further increase productivity, the 3110-FT offers an optional remote control function allowing operating the handler from any location via an internet connection. The 3110-FT also comprises soaking buffer that can improve the testing cycle time and throughput. Equipped with two auto output tray stacks and two manual output trays, the 3110-FT can maximize the loading and unloading capacity to save the cost and time all within a 1.4 m² floor space.

When integrated with Chroma Hybrid Chiller & TEC controller, the 3110-FT can control not only case temperature but also junction temperature when performing tri-temp test.

The 3110-FT can be configured to support virtually any industry standard communication interface and provide different docking options for various testers. It is also capable of supporting thermal test environments from -40˚C t o 125˚C which ensures the durability of devices. With a user-friendly graphic interface and quick device change setup, it makes the changeover short and easy further increasing flexibility and productivity.