Today’s logic IC has to integrate multiple functions. The complex System-on-Chip (SoC) is not only equipped with the features of digits, simulation, power and built-in storage, but is also a challenge for test devices.

The VLSI test system can precisely simulate the logic IC's electric signals and rapidly interpret the test results. The expansion of Test Head is capable of executing multiple test programs for massive multi-sites to improve the throughput. In addition, the customized test device can replace the general purpose tester to fit in the specified requirements that can actually meet the goal of reducing test cost.

In the back end of IC process, handlers are used to sort the products with different types of package. After package testing, the Automatic System Function Tester, which tests IC in a real environment instead of simulation by IC testers, are used for tests of complicated IC with high fault coverage and low cost and highly improves test quality.