Key Features Up to x8 Parallel Test Sites Up to 9000 UPH Flexible Test Site Configuration Dampened Contact Force Contact Force Auto Learning 3x3 mm ~ 50x50 mm Packages Up to 6 Output Tray Locations Temperature Test from Ambient ~ 150 ℃ Intelligent Auto Retest & Auto Retry Yield Monitor Socket auto clean function* (option) Two in one shuttle CE marked and certified * Socket clean pad needs to be provided by customers.

The Chroma 3180 Handler is a productive pick & place system for high volume multi-site IC testing. Saving floor space, time and cost, the 3180 can increase production productivity and efficiency with its innovative design. The system is configurable for single, dual, quad or octal test sites and can be upgraded to test the DUT up to 150 ℃.

The Chroma 3180 is also capable of handling various package sizes and types then bins them according to customer specified test results. The system has a reliable handling mechanism, is compatible with standard Conversion Kits and has a streamlined automation sequence, which results in high throughput with low jam rate. Its precisely adjustable contact force, fine alignment positioning and various device sensors also reduces unexpected device damage and helps extend test socket lifetime while maintaining or increasing production yields.