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Model 3160 Final Test Handler
Model 3110 Hybrid Single Site Test Handler   Key Features
  • Flexible DUT Configuration
  • Adjustable P&P Interval
  • Air damper buffer to reduce contact force impact
  • Intelligent socket IC leftover check
  • Auto Contact Force Learning
  • Color Tray Mode availability
  • Yield Monitor (per contact dead)
  • Yield Control (average yield rate of socket)
  • Compatible change kits with NS-5000 / 6000 / 6040

Data Sheet


Product Details

The Chroma 3160 Handler is a productive pick & place system for high volume multi-site IC testing. Saving floor space, time, and cost, the 3160 can increase production productivity and efficiency with its innovative design. The system is congurable for Single, Dual or Quad test sites and can be upgraded to provide an Active Thermal Control (ATC) System to test the DUT up to 150°C.

The Chroma 3160 is also capable of handling various package sizes and types then bins them according to customer specied test results. The system has a reliable handling mechanism, is compatible with standard Conversion Kits and has a streamlined automation sequence, which results in high throughput with low jam rate. Its precisely adjustable contact force, fine alignment positioning and various device sensors also reduces unexpected device damage and helps extend test socket lifetime while maintaining or increasing production yields.


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In-Line Test Site

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