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Model 3650-EX SoC/Analog Test System

3650

Key Features

  • 10 interchangeable slots for digital, analog and mixed-signal applications
  • 50/100 MHz clock rate, 100/200 Mbps data rate
  • Up to 512 sites parallel test
  • Up to 1024 digital I/O pins
  • 32/64 MW vector memory
  • Up to 32 CH PMU for high precision measurement
  • Per-pin timing/ PPMU/ frequency measurement
  • Scan features to 4G depth / 32 scan chains
  • ALPG option for memory test
  • Switching timing accuracy ±300ps
  • Up to 64 CH high-voltage pins
  • 96 CH high density DPS
  • 32 CH HDADDA mixed-signal option
  • 8~32 CH VI45 analog option
  • 2~8 CH PVI100 analog option
  • MRX option for 3rd party PXI/PXIe applications
  • Microsoft Windows® 7 OS
  • C++ and GUI programming interface
  • CRISP, full suite of intuitive software tools
  • Test program and pattern converters for other platforms
  • Accept DIB and probe card of other testers directly
  • Support STDF data output
  • Air-cooled, small footprint tester-in-a-test-head design

Data Sheet

 

Product Details

Semiconductor manufacturing is a fast moving industry; more and more devices are highly integrated with various functions. Capital equipment must be built to outlive several device generations and applications. With varieties of available options, such as AD/DA converter test, ALPG for memory test, high voltage PE, multiple scan chain test, VI45 & PVI100 analog test options and HDADDA mixed-signal test options, Chroma 3650-EX can provide a wide coverage for customer to test different kind of devices with flexible configurations.

Moreover, Chroma 3650-EX platform architecture allows development of focused instruments by third-party suppliers that can be easily added for specific applications. It can stretch the boundaries of test by covering a broader range of devices than ever before possible in a low-cost production test system.

3650-EX achieves lower test cost not only by reducing the cost of tester system but also by testing more devices faster with higher parallel test capability. With Chroma PINF IC and the sophisticated calibration system, 3650-EX has the excellent overall timing accuracy better than other low cost ATE. With the any-pin-to-any-site mapping design, 3650- EX provides up to 512 sites high throughput parallel testing capabilities to enlarge the mass production performance with more flexible and easy layout.

Chroma 3650-EX brings you the most cost-effective SoC tester 
Chroma 3650-EX is specifically designed for high-throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and excellent reliability, 3650-EX is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.

High performance in a low-cost production system 
3650-EX achieves lower test cost not only by reducing the cost of tester system but also by testing more devices faster with higher parallel test capability. With Chroma PINF IC and the sophisticated calibration system, 3650-EX has the excellent overall timing accuracy better than other low cost ATE. The pattern generator of 3650-EX has up to 64M depth pattern instruction memory. By having the same depth as the vector memory, Chroma 3650-EX allows to add pattern instruction for each vector. Moreover, the powerful sequential pattern generator provides the variety of micro instructions to meet all kinds of different demands of complex test vectors. Hardware true per-pin architecture and the flexible site mapping with no slot boundaries are designed for multisite test with high throughput. Up to 1024 digital pins, 96 device power supplies, per-pin PMU, mixed-signal and analog test capability, 3650-EX delivers a combination of high test performance and throughput with cost-effective test solution.

High parallel test capability 
The powerful, versatile parallel pin electronics resources of 3650-EX can simultaneously perform identical parametric tests on multiple pins. 3650- EX integrates 128 digital pins into one slot. In each LPC board, it contains high performance Chroma PINF ICs which supports timing generation. The integration of local controller circuitry manages resources setup and result readout, and therefore cuts the overhead time of the system controller. With the any-pin-to-any-site mapping design, 3650-EX provides up to 512 sites high throughput parallel testing capabilities to enlarge the mass production performance with more flexible and easy layout.

Flexibility 
Semiconductor manufacturing is a fast moving industry; more and more devices are highly integrated with various functions. Capital equipment must be built to outlive several device generations and applications. With varieties of available options, such as AD/DA converter test, ALPG for memory test, high voltage PE, multiple scan chain test, VI45 & PVI100 analog test options and HDADDA mixed-signal test options, Chroma 3650-EX can provide a wide coverage for customer to test different kind of devices with flexible configurations. Moreover, Chroma 3650-EX platform architecture allows development of focused instruments by third-party suppliers that can be easily added for specific applications. It can stretch the boundaries of test by covering a broader range of devices than ever before possible in a low-cost production test system.

From design to production 
Chroma 3650-EX build-in MRX solution can support PXI instrumentation which can provide users wider coverage to different kind of applications. For those users use PXI instrumentation for their design validation and verification, they can move PXI instrumentation directly to 3650-EX for production. There will be less uncorrelated issues happened on design stage and production by using the same PXI instrumentation. Chroma 3650-EX had successfully integrated several PXI solutions like Audio, Video and RF applications not only on hardware integration, also for build-in libraries and tools in software to help users control PXI instrumentation more easily and enable accelerated test program development, reducing product time to market.

 
                 
 
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