Model 58635
Photonics Device Probing Test System
Key Features
- References: ISO/IEC standards
- Up to 6" wafer
- Temperature
- Wide range
- Precise temperature control
- Support both QCW and CW operation
- Four types of models
- LIV-λ test : Model 58635-L
- Near Field test : Model 58635-N
- Far Field test : Model 58635-F
- LIV-λ & NF two-in-one test : 58635-LN
- Support multisite testing
- High speed short pulse option
