Chroma's photonics test solutions address mainly on automated test equipment for laser diode, VSCEL, LED both in wafer and chip format as well as optical communication active components.
With more than 30 years of power electronic and automated optical test experience, Chroma offers many integrated mechanism and temperature control technology capable of performing reliable characteristics and aging test for optical devices under various temperature test conditions.
Download the Photonics Test Solutions brochure
Test Systems
Model 58604
Laser Diode Burn-in and Reliability Test System
- Applicable for burn-in, reliability, and life testing
- AAC and APC control modes
- Individual channel driving and measurement
Model 58605
High Power Laser Diode Burn-in and Reliability Test System
- Burn-in, reliability, and life test
- AAC and APC control modes
- Independent channel for source and measurement
- Spike-Free sourcing
Model 58602
Optoelectronic Source Measurement System
- Burn-in, Reliability, and Life Testing
- Up to 6912 Channels
- Up to 20A per device
- Up to 150°C
- CoS, C-Mount, T0, VCSEL Card, VCSEL Package, Custom
Model 58606
Photodioe Burn-in and Reliability Test System
- Burn-in, reliability, and life test
- Dark Current and Breakdown Voltage
- 256 channels Bi-polar device source per drawer
Model 58620
Laser Diode Characterization System
- Full Turn-Key Automated Test for edge and surface emitting laser diodes
- High precision and large capacity carrier, interchangeable with other automated equipment
Model 58635
Photonic Array Wafer Probing Test System
- References: ISO/IEC standards
- Up to 6” water
- Wide range and precise temperature control
Model 58212-C
LED mapping Probe Tester Model
- High speed and accuracy
- Lateral, verticle, and flip chip
- Wide power test range (up to 200V/2A)
- Up to 8" wafers
- Chroma® Huge Photo Detector
Model 58625
Photonics Module Test System
- All-in-one test system
- Flexible test station arrangement
- Precise temperature control -20~85°C
- Large bea angl measurement
- Nanosecond high-speed testing (optional)
