Model 58636
Short Pulse Photonics Device Probing Test System
Key Features
- Short pulse: Support nanosecond-scale pulse generation
- Digital control: Provide digital control for heterogeneous integration
DUTs, including VoS (VCSEL on System) and VoD (VCSEL on Driver) - Waveform measurement: Gain deeper insight into DUT behavior
by utilizing waveform output mode (Engineering mode) - Multi-site/Multi-die test: Significantly reduces testing time and boosts testing efficiency
- 6- or 8-inch chuck: Handle wafer sizes up to 8 inches
- Electrical and near-field filed optics test: Patented Two-in-one optical head design
