Model 3110
Hybrid Single Site Test Handler
Key Features
- FT and SLT compatible handler
- Ideal for device engineering characterization and analysis
- Compatible kit to scale-up production
- ATC Tri-temp -40 to 150 ℃ IC test (Optional -55 to 150℃ , -70 to 150℃)
- Auto tray loading/unloading and device sorting capability
- Air damper design ensures good contact balance
- Transfer shuttle remain IC check function
- Contact force 80/180kgf (Optional 450kgf)
- Optional dual force for bare die test
- Optional liquid submersion system
Applications
- AI Chips
- Automotive semiconductors
- HPC related test
- Other advanced packaged semiconductors
