The Chroma 3280 is an innovative integration system for testing and handling SD cards in parallel without picking any part before sorting. SD Protocol Aware and Focused DC tests in the 3280 brings a revolutionary test methodology to all SD cards (including MMC). The benefit to customers is lower manufacturing cost from the high throughput of the 3280. The compact size of 3280 also saves floor space in the manufacturing facility.

The cost sensitivity involved with consumer products challenges traditional final test methodology. To reduce the cost to consumers, manufacturers must recognize the fact that SD cards are built upon Known Good Die (KGD). This recognition will narrow the tester's focus to assembly related defects rather than retesting KGD. A new focused tester that tests for assembly will be smaller and less expensive than traditional solutions. That smaller size then allows for more parts to be tested in parallel in a reduced area, further reducing the unit of test cost. Additionally, the high yield of SD cards using KGD leads to a small footprint Test-in- Tray mechanism. This integrated combination of tester and handler with a reduced footprint facilitates low cost solution of the Chroma 3280.