Model 3650
SoC / Analog Test System
Key Features
- 50 / 100 MHz clock rate; 100 / 200 Mbps (MUX) data rate
- Up to 640 digital I/O pins (testhead 2)
- 32 MW vector memory
- 32 MW pattern instruction memory
- Per-pin PPMU / frequency measurement
- Scan features to 2G depth per scan chain
- ALPG option for memory test
- Up to 40 high-voltage I/O pins
- Up to 8-32 16-bit ADDA channels option
- 32 high-performance DPS channels
- Edge placement accuracy ±300ps
- 32-CH HDADDA mixed-signal option
- 8-CH AWG and digitizer ASO mixed-signal audio band test option
- Max. 3750V (stacked) for HVVI analog option
- Max. 320A pulse mode (ganged) for MPVI analog option
- 32-CH / board for VI45 analog option
- 8-CH / board for PVI100 analog option
- Microsoft Windows® 7 / Windows® 10
- C++ and GUI programming interface
- CRISP, full suite of intuitive software tools
- Test program and pattern converters for other platforms
- Accept DIB and probe card of other testers by adding conversion kit
- Support STDF data output
- Air-cooled, small footprint
