Model 3650-S2
SoC / Analog Test System
Key Features
- 12 Universal slots for digital, analog and mixed-signal applications
- Up to 768 digital I/O and analog pins
- 50 / 100 MHz clock rate
- 100 / 200 Mbps (MUX) data rate
- Edge placement accuracy ±300ps
- 32 MW vector memory
- 32 MW pattern instruction memory
- Per-pin PPMU / frequency measurement
- Scan features to 2G depth per scan chain
- ALPG option for memory test
- Up to 48 high-voltage I/O pins
- Various floating ground VI resources
- 64-CH / board for HDDPS2 DPS option
- Max. 3750V (stacked) for HVVI analog option
- 8-CH AWG and 8-CH Digitizer ASO mixed-signal audio band test option
- Max. 320A pulse mode (ganged) for MPVI analog option
- 32-CH / board for VI45 analog option
- 8-CH / board for PVI100 analog option
- Significantly increases LB components area
- Larger power supply for the tester
- Microsoft Windows® 7 / Windows® 10
- C++ and GUI programming interface
- CRISP (full suite of intuitive software tools)
- Test program and pattern converters for other platforms
- Accepts DIB and probe card of other testers by adding conversion kit
- Supports STDF data output
- Air-cooled, small footprint
