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LED Test & Automation Instruments

 

The LED industry has grown as a result of greater interest in energy savings and environmental protection. The production process of an LED module starts from Epitaxy (EPI) to Chip Process and then ends with Package. Different LED products are designed to meet the diversified requirements of various industries such as mobile phones, vehicle lamps, and LCD backlights.

Chroma's LED test equipment can be applied to die saw and expansion prior or subsequent for electricity, optics, and electrostatic discharge (ESD) tests. With the user interface integrated prober it can inspect the LED rapidly. For package phase, it can perform electrostatic discharge, thermal resistance and tri-temperature tests to simulate the environment changes in temperature and humidity for measuring the electrical and optical characteristics of LED. Furthermore, it can perform life cycle tests on LED Flash Light, LED Light Bar and OLED for LED modules. This solution also provides various customized LED electrical and optical test equipment for diverse test applications.

Click here for more information on Chroma's turn-key LED solutions.

Wafer Test Systems
58182
Model 58212-C
Photonic Wafer Probing Test System
  • High speed and accuracy
  • Lateral, vertical, and flip chip
  • Wide power test range (up to 200V/2A)
  • Up to 8 inch wafers
  • Chroma® Huge Photo Detector
 
 
Wafer Inspection Systems
Chroma 7945 In-process Wafer Die Inspection System
Model 7945
In-process Wafer Die Inspection System
  • Double side inspection (post-diced wafer)
  • Full color defect detection
  • Selectable resolution and algorithms: VCSELs, PDs, LEDs, and Discrete Devices
Chroma 7935 Wafer Inspection System
Model 7940
Wafer Chip Inspection System
  • Simultaneous double side color inspection
  • 6" wafer / 8" inspection area
  • Automatic wafer alignment
  • Wafer shape / edge identification
 
Burn-In, Reliability and Life Test Systems
Chroma 58601 Optoelectonic Source Measurement System
Model 58602
Optoelectronic Source Measurement System
  • Burn-In, Reliability and Life Testing
  • Up to 6912 Channels
  • Up to 20A per device
  • Up to 150°C
Model 58606
Photodiode Burn-in and Reliability Test System
  • Burn-in, reliability and life test
  • Dark Current and Breakdown Voltage
  • 256 channels Bi-polar device source per drawer
 
 
Test Instruments
Chroma 52411 Dual Independent & Isolated Source Measure Unit
Model 52400 Series
Four Quadrant Source
  • High & programmable voltage / current slew rate 
  • Low output noise 
  • High programming / measurement speed
Model 54100
Advanced TEC Controller
  • Bidirectional driving with 300W (27V/12A) and 800W (40V/20A) output
  • Filtered PWM output with > 90% driving power efficiency
58154
Model 58154
ESD Test System
  • Two Model ESD Pulse Generation : Human body model and Machine model
  • Programmable Auto Test : Pulse delay, cycle and polarity are programmable
Series 51101 / 51101C
Thermal/Multi-Function
Data Logger
  • Models with 1, 8, and 64 channels on-line data recording.
  • Support B, E, J, K, N, R, S, and T type thermal couples
 
 
                 
     
                 

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