• 24 interchangeable slots for digital, analog, and mixed-signal applications
• 150 Mbps up to 1Gbps data rate (muxed)
• Up to 512 sites parallel test
• Up to 2048 digital I/O pins
• 256 MW vector memory (512 MW option) (X2 mode)
• Up to 64 CH PMU for high precision measurement
• Per-pin timing measurement unit/PPMU/frequency measurement
• Scan features to 8G depth/scan chain (16G option)
• Edge placement accuracy (EPA): ±150ps
• Up to 128 CH High density DPS32
• High density HDADDA2 mixed-signal option
• Efficient high power HCDPS analog option
• High performance HDAVO option
• High density HDVI analog option
• High parallel HDRF option*
• Direct probing system
• Multi-time domain function
• Microsoft Windows 10 OS
• C#.NET and GUI programming interface
• CRISPro, full suite of intuitive software tools
• Test program and pattern converters for other platforms
• Accept DIB and probe card of other testers directly
• Support STDF data output and customized data format
• Air-cooled, small footprint tester-in-a-test-head design

*Call for avaliability